Part Number : 15-1326286-1
Manufacturer : Gte Government Systems Corp
NSN : 5962-01-375-7492
(5962013757492)
Alternate P/N : 1513262861
You can submit the RFQ form below for Part Number 15-1326286-1, Microcircuit Memory by Manufacturer Gte Government Systems Corp with NSN 5962013757492. Please ensure that all information is appropriately filled. These answers will help us offer you a better service.
Aviation Orbit, an ASAP Semiconductor company, is a leading distributor of Gte Government Systems Corp and obsolete NSN parts such as 15-1326286-1. We support defense/military, aerospace, commercial and industrial clients by supplying essential NSN parts at competitive prices.
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5962-01-375-7492 Item Description: Microcircuit Memory | 5962 | 013757492 | 0 | N | B | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| 7 | B | A | 0 | |||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| 15-1326286-1 | 5 | 9 | 3 |
| MRC | Criteria | Characteristic |
|---|---|---|
| AGAV | End Item Identification | HAC/RMPE REACT BASIC |
| NHCF | Nuclear Hardness Critical Feature | HARDENED |
| CZZZ | Memory Capacity | 128K X 8 |
| CTQX | Current Rating Per Characteristic | 5.00 MICROAMPERES MAXIMUM INPUT |
| CBBL | Features Provided | BURN IN, MIL-STD-883, CLASS B AND ELECTROSTATIC SENSITIVE AND MONOLITHIC AND RADIATION HARDENED AND ULTRAVIOLET ERASABLE AND TESTED TO MIL-STD-883 AND SELECTED ITEM |
| CZER | Memory Device Type | EPROM |
| AFJQ | Storage Temp Range | -65.0/+150.0 DEG CELSIUS |
| TEST | Test Data Document | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| ADAT | Body Width | 0.585 INCHES MINIMUM AND 0.605 INCHES MAXIMUM |
| FEAT | Special Features | ELECTROSTATIC DISCHARGE SENS/HARDNESS CRITICAL ITEM; SELECTED ITEM; SELECTED FROM P/N 5962-8961404MXX OR 5962-8961405MXX,CAGE 67268 |
| SPCL | Special Test Features | SELECTED AND TESTED FOR RADIATION HARDNESS |
| CQSZ | Inclosure Configuration | DUAL-IN-LINE |
| ADAQ | Body Length | 1.660 INCHES MINIMUM AND 1.680 INCHES MAXIMUM |
| AEHX | Maximum Power Dissipation Rating | 330.0 MILLIWATTS |
| ADAU | Body Height | 0.200 INCHES MINIMUM AND 0.220 INCHES MAXIMUM |
| CZEN | Voltage Rating And Type Per Characteristic | -0.6 VOLTS MINIMUM TOTAL SUPPLY AND 7.0 VOLTS MAXIMUM TOTAL SUPPLY |
| TTQY | Terminal Type And Quantity | 32 PRINTED CIRCUIT |
| CQSJ | Inclosure Material | CERAMIC |
| CXCY | Part Name Assigned By Controlling Agency | MICROCIRCUIT,PROM,128K X 8 (27C010); MICROCIRCUIT,MEMORY DIGITAL,CMOS 128K X 8-BIT UVEPROM,MONOLITHIC SILICON |
| MRC | Decoded Requirement | Clear Text Reply |
| AFGA | Operating Temp Range | -55.0/+125.0 DEG CELSIUS |
| CWSG | Terminal Surface Treatment | SOLDER |
| CZEQ | Time Rating Per Chacteristic | 150.00 NANOSECONDS MINIMUM ACCESS AND 170.00 NANOSECONDS MAXIMUM ACCESS |
| CQWX | Output Logic Form | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| CRTL | Criticality Code Justification | FEAT |
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